Radiation Protection Dosimetry Advance Access published online on April 27, 2006
Radiation Protection Dosimetry, doi:10.1093/rpd/nci547
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SSD 2004 Special Issue Articles
1 Kyosemi Corporation, Toiso 385-31, Eniwa 061-1405, Japan; Department of Quantum Engineering and Systems Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
* To whom correspondence should be addressed.
A novel real-time dosimetry technique based on radiation-induced surface activation (RISA) phenomenon has been proposed that is similar to ultraviolet surface activation known typically in anatase-type titanium dioxide. It has been found that the RISA phenomenon occurs on the surface of an oxidised semiconductor or oxidised metal film by radiation incidence. The RISA dosemeter has the following advantageous characteristics: (1) output of the RISA dosemeter is proportional to the dose equivalent rate in harsh environments, (2) fluctuation of output of the RISA dosemeter irradiated by 60Co gamma-rays is <2.5% beyond the total dose equivalent of 1.8 MSv, (3) the transient current observed in simple insulators for a few seconds or more after onset of irradiation was not detected in the RISA dosemeter and (4) this dosemeter worked well even at high temperatures.
A NOVEL REAL-TIME DOSIMETRY TECHNIQUE BASED ON RADIATION-INDUCED SURFACE ACTIVATION
H. Tomozawa 1 *,
T. Takamasa 2,
K. Okamoto 3,
N. Tsujimura 4,
H. Date 5,
and
J. Nakata 6
2 Faculty of Marine Technology, Tokyo University of Marine Science and Technology, Etchujima, Koto, Tokyo 135-8533, Japan
3 Department of Quantum Engineering and Systems Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
4 Radiation Protection Division, Japan Nuclear Cycle Development Institute, 4-33 Muramatsu, Tokai, Ibaraki 319-1194, Japan
5 School of Medicine and Health Sciences, Hokkaido University, Sapporo 060-0812, Japan
6 Kyosemi Corporation, Toiso 385-31, Eniwa 061-1405, Japan
H. Tomozawa, E-mail: tomozawa{at}kyosemi.co.jp
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