Skip Navigation



Radiation Protection Dosimetry Advance Access published online on April 27, 2006

Radiation Protection Dosimetry, doi:10.1093/rpd/nci547
This Article
Right arrow Full Text (PDF)
Right arrow All Versions of this Article:
120/1-4/373    most recent
nci547v1
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Tomozawa, H.
Right arrow Articles by Nakata, J.
Right arrow Search for Related Content
PubMed
Right arrow PubMed Citation
Right arrow Articles by Tomozawa, H.
Right arrow Articles by Nakata, J.
Social Bookmarking
 Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

© The Author 2006. Published by Oxford University Press. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org

SSD 2004 Special Issue Articles

A NOVEL REAL-TIME DOSIMETRY TECHNIQUE BASED ON RADIATION-INDUCED SURFACE ACTIVATION

H. Tomozawa 1 *, T. Takamasa 2, K. Okamoto 3, N. Tsujimura 4, H. Date 5, and J. Nakata 6

1 Kyosemi Corporation, Toiso 385-31, Eniwa 061-1405, Japan; Department of Quantum Engineering and Systems Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
2 Faculty of Marine Technology, Tokyo University of Marine Science and Technology, Etchujima, Koto, Tokyo 135-8533, Japan
3 Department of Quantum Engineering and Systems Science, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
4 Radiation Protection Division, Japan Nuclear Cycle Development Institute, 4-33 Muramatsu, Tokai, Ibaraki 319-1194, Japan
5 School of Medicine and Health Sciences, Hokkaido University, Sapporo 060-0812, Japan
6 Kyosemi Corporation, Toiso 385-31, Eniwa 061-1405, Japan

* To whom correspondence should be addressed.
H. Tomozawa, E-mail: tomozawa{at}kyosemi.co.jp


   Abstract

A novel real-time dosimetry technique based on radiation-induced surface activation (RISA) phenomenon has been proposed that is similar to ultraviolet surface activation known typically in anatase-type titanium dioxide. It has been found that the RISA phenomenon occurs on the surface of an oxidised semiconductor or oxidised metal film by radiation incidence. The RISA dosemeter has the following advantageous characteristics: (1) output of the RISA dosemeter is proportional to the dose equivalent rate in harsh environments, (2) fluctuation of output of the RISA dosemeter irradiated by 60Co gamma-rays is <2.5% beyond the total dose equivalent of 1.8 MSv, (3) the transient current observed in simple insulators for a few seconds or more after onset of irradiation was not detected in the RISA dosemeter and (4) this dosemeter worked well even at high temperatures.


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.