Skip Navigation

This Article
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Yamamoto, T.
Right arrow Articles by Oda, K.
Right arrow Search for Related Content
PubMed
Right arrow Articles by Yamamoto, T.
Right arrow Articles by Oda, K.
Social Bookmarking
Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

Radiation Protection Dosimetry 33:23-26 (1990)
© 1990 Oxford University Press

Transient Dose Distribution in LiF Single Crystals Irradiated with High Energy Pulsed Electrons

T. Yamamoto and K. Oda

The build-up stage of short-lived excitons corresponds to the accumulating stage of the absorbed dose at the same region. Hence sequential observation of the former stage would make it possible to pursue the temporal variation of the accumulating absorbed dose. A pulse radiolysis system enables one to obtain the transient depth-dose profile in a sample irradiated with high energy electrons of 20 ps pulse duration by measuring the build-up process of the optical density through the sample. It has been observed that the electron energy is deposited to a certain depth in about 100 ps after the primary electrons have passed through that region. This means that the energy deposition is mainly attributed not to the primary electrons but to the slower secondary ones.


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.