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Radiation Protection Dosimetry Advance Access originally published online on March 10, 2007
Radiation Protection Dosimetry 2006 122(1-4):36-40; doi:10.1093/rpd/ncl473
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© The Author 2006. Published by Oxford University Press. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org

An analytical model for calculating microdosimetric distributions from heavy ions in nanometer site targets

L. Czopyk* and P. Olko

Institute of Nuclear Physics PAN, ul. Radzikowskiego 152, 31-342 Kraków, Poland

* Corresponding author: Lukasz.Czopyk{at}ifj.edu.pl


  Abstract

The analytical model of Xapsos used for calculating microdosimetric spectra is based on the observation that straggling of energy loss can be approximated by a log-normal distribution of energy deposition. The model was applied to calculate microdosimetric spectra in spherical targets of nanometer dimensions from heavy ions at energies between 0.3 and 500 MeV amu–1. We recalculated the originally assumed 1/E2 initial delta electrons spectrum by applying the Continuous Slowing Down Approximation for secondary electrons. We also modified the energy deposition from electrons of energy below 100 keV, taking into account the effective path length of the scattered electrons. Results of our model calculations agree favourably with results of Monte Carlo track structure simulations using MOCA-14 for light ions (Z = 1–8) of energy ranging from E = 0.3 to 10.0 MeV amu–1 as well as with results of Nikjoo for a wall-less proportional counter (Z = 18).


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P. Olko, P. Bilski, M. Budzanowski, L. Czopyk, J. Swakon, and M. P. R. Waligorski
Microdosimetric modelling of the response of thermoluminescence detectors to low- and high-LET ionising radiation
Radiat Prot Dosimetry, December 1, 2006; 122(1-4): 378 - 381.
[Abstract] [Full Text] [PDF]


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